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101150-000 - 

SEMICONDUCTOR PROBE

Smiths Interconnect Americas, Inc. 101150-000
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制造商產(chǎn)品編號(hào)：
101150-000
倉(cāng)庫(kù)庫(kù)存編號(hào)：
70009137
技術(shù)數(shù)據(jù)表：
View 101150-000 Datasheet Datasheet
訂購(gòu)熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫(kù)龐大，部分產(chǎn)品信息可能未能及時(shí)更新，下單前請(qǐng)與銷(xiāo)售人員確認(rèn)好實(shí)時(shí)在庫(kù)數(shù)量，謝謝合作！

101150-000產(chǎn)品概述

Semiconductor Probe, 5 A Current, 0.050 in. Pitch
  • 1.1 Oz. spring
    0.037 pF capacitance rating.

    • 101150-000產(chǎn)品信息

      Bandwidth  10 GHz @ -0.724 dB  
      Brand/Series  101150 Series  
      Capacitance  0.037 pF  
      Centerline, Spacing  0.026 (0.65) In.(mm) In.(mm)  
      Contact Resistance  70 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  5 A A  
      Force, Spring  1.1 Oz. Oz.  
      Gender  Probe  
      Impedance  50 Ohms  
      Inductance  0.68 nH (Self) @ 0.050 in. Pitch  
      Length, Overall  0.138 In. In.  
      Material, Barrel  Phosphor Bronze  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Phosphor Bronze  
      Material, Spring  Stainless Steel  
      Minimum Centers  0.026 In.  
      Primary Type  Probe  
      Temperature, Operating  -55 to +150 °C  
      Tip Style  Serrated/Chisel  
      Type  Semiconductor  
    關(guān)鍵詞         

    101150-000相關(guān)搜索

    Bandwidth 10 GHz @ -0.724 dB  Smiths Interconnect Americas, Inc. Bandwidth 10 GHz @ -0.724 dB  Spring Test Probes Bandwidth 10 GHz @ -0.724 dB  Smiths Interconnect Americas, Inc. Spring Test Probes Bandwidth 10 GHz @ -0.724 dB   Brand/Series 101150 Series  Smiths Interconnect Americas, Inc. Brand/Series 101150 Series  Spring Test Probes Brand/Series 101150 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 101150 Series   Capacitance 0.037 pF  Smiths Interconnect Americas, Inc. Capacitance 0.037 pF  Spring Test Probes Capacitance 0.037 pF  Smiths Interconnect Americas, Inc. Spring Test Probes Capacitance 0.037 pF   Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.026 (0.65) In.(mm) In.(mm)   Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 70 Milliohms (Max.) Milliohms (Max.)   Current Rating 5 A A  Smiths Interconnect Americas, Inc. Current Rating 5 A A  Spring Test Probes Current Rating 5 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 5 A A   Force, Spring 1.1 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 1.1 Oz. Oz.  Spring Test Probes Force, Spring 1.1 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 1.1 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Impedance 50 Ohms  Smiths Interconnect Americas, Inc. Impedance 50 Ohms  Spring Test Probes Impedance 50 Ohms  Smiths Interconnect Americas, Inc. Spring Test Probes Impedance 50 Ohms   Inductance 0.68 nH (Self) @ 0.050 in. Pitch  Smiths Interconnect Americas, Inc. Inductance 0.68 nH (Self) @ 0.050 in. Pitch  Spring Test Probes Inductance 0.68 nH (Self) @ 0.050 in. Pitch  Smiths Interconnect Americas, Inc. Spring Test Probes Inductance 0.68 nH (Self) @ 0.050 in. Pitch   Length, Overall 0.138 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.138 In. In.  Spring Test Probes Length, Overall 0.138 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.138 In. In.   Material, Barrel Phosphor Bronze  Smiths Interconnect Americas, Inc. Material, Barrel Phosphor Bronze  Spring Test Probes Material, Barrel Phosphor Bronze  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Phosphor Bronze   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Phosphor Bronze  Smiths Interconnect Americas, Inc. Material, Plunger Phosphor Bronze  Spring Test Probes Material, Plunger Phosphor Bronze  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Phosphor Bronze   Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel  Spring Test Probes Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel   Minimum Centers 0.026 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.026 In.  Spring Test Probes Minimum Centers 0.026 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.026 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Temperature, Operating -55 to +150 °C  Smiths Interconnect Americas, Inc. Temperature, Operating -55 to +150 °C  Spring Test Probes Temperature, Operating -55 to +150 °C  Smiths Interconnect Americas, Inc. Spring Test Probes Temperature, Operating -55 to +150 °C   Tip Style Serrated/Chisel  Smiths Interconnect Americas, Inc. Tip Style Serrated/Chisel  Spring Test Probes Tip Style Serrated/Chisel  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Serrated/Chisel   Type Semiconductor  Smiths Interconnect Americas, Inc. Type Semiconductor  Spring Test Probes Type Semiconductor  Smiths Interconnect Americas, Inc. Spring Test Probes Type Semiconductor  
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