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101050-003 2.3OZ. - 

2.3 OZ. SPRING FORCE RATED STROKE BATTERY CONTACT PROBE

Smiths Interconnect Americas, Inc. 101050-003 2.3OZ.
聲明：圖片僅供參考，請(qǐng)以實(shí)物為準(zhǔn)！
制造商產(chǎn)品編號(hào)：
101050-003 2.3OZ.
倉(cāng)庫(kù)庫(kù)存編號(hào)：
70009131
技術(shù)數(shù)據(jù)表：
View 101050-003 2.3OZ. Datasheet Datasheet
訂購(gòu)熱線： 400-900-3095  0755-21000796, QQ:800152669, Email:sales@szcwdz.com
由于產(chǎn)品數(shù)據(jù)庫(kù)龐大，部分產(chǎn)品信息可能未能及時(shí)更新，下單前請(qǐng)與銷(xiāo)售人員確認(rèn)好實(shí)時(shí)在庫(kù)數(shù)量，謝謝合作！

101050-003 2.3OZ.產(chǎn)品概述

Measurement Range -40 to +260 °C 80BK Integrated DMM Temperature Probe
  • Mounting flange
  • Bias ball
    0.060 " Working travel.

    • 101050-003 2.3OZ.產(chǎn)品信息

      Brand/Series  101050 Series  
      Centerline, Spacing  0.125 (3.18) In.(mm) In.(mm)  
      Contact Resistance  25 Milliohms (Max.) Milliohms (Max.)  
      Current Rating  5 A A  
      Diameter, Hole  0.02 In.  
      Force, Spring  2.3 Oz. Oz.  
      Gender  Probe  
      Length, Overall  0.325 In. In.  
      Material, Barrel  Nickel/Silver  
      Material, Bias Ball  Stainless Steel  
      Material, Plating  Gold Plated (Plunger)  
      Material, Plunger  Beryllium Copper  
      Material, Spring  Stainless Steel  
      Maximum Travel  0.090 In.  
      Minimum Centers  0.125 In.  
      Primary Type  Probe  
      Tip Style  Spherical Radius  
      Type  Battery Contact  
      Working Travel  0.06  
    關(guān)鍵詞         

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    • 參考圖片
    • 制造商 / 說(shuō)明 / 型號(hào) / 倉(cāng)庫(kù)庫(kù)存編號(hào)
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    101050-003 2.3OZ.相關(guān)搜索

    Brand/Series 101050 Series  Smiths Interconnect Americas, Inc. Brand/Series 101050 Series  Spring Test Probes Brand/Series 101050 Series  Smiths Interconnect Americas, Inc. Spring Test Probes Brand/Series 101050 Series   Centerline, Spacing 0.125 (3.18) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Centerline, Spacing 0.125 (3.18) In.(mm) In.(mm)  Spring Test Probes Centerline, Spacing 0.125 (3.18) In.(mm) In.(mm)  Smiths Interconnect Americas, Inc. Spring Test Probes Centerline, Spacing 0.125 (3.18) In.(mm) In.(mm)   Contact Resistance 25 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Contact Resistance 25 Milliohms (Max.) Milliohms (Max.)  Spring Test Probes Contact Resistance 25 Milliohms (Max.) Milliohms (Max.)  Smiths Interconnect Americas, Inc. Spring Test Probes Contact Resistance 25 Milliohms (Max.) Milliohms (Max.)   Current Rating 5 A A  Smiths Interconnect Americas, Inc. Current Rating 5 A A  Spring Test Probes Current Rating 5 A A  Smiths Interconnect Americas, Inc. Spring Test Probes Current Rating 5 A A   Diameter, Hole 0.02 In.  Smiths Interconnect Americas, Inc. Diameter, Hole 0.02 In.  Spring Test Probes Diameter, Hole 0.02 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Diameter, Hole 0.02 In.   Force, Spring 2.3 Oz. Oz.  Smiths Interconnect Americas, Inc. Force, Spring 2.3 Oz. Oz.  Spring Test Probes Force, Spring 2.3 Oz. Oz.  Smiths Interconnect Americas, Inc. Spring Test Probes Force, Spring 2.3 Oz. Oz.   Gender Probe  Smiths Interconnect Americas, Inc. Gender Probe  Spring Test Probes Gender Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Gender Probe   Length, Overall 0.325 In. In.  Smiths Interconnect Americas, Inc. Length, Overall 0.325 In. In.  Spring Test Probes Length, Overall 0.325 In. In.  Smiths Interconnect Americas, Inc. Spring Test Probes Length, Overall 0.325 In. In.   Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Material, Barrel Nickel/Silver  Spring Test Probes Material, Barrel Nickel/Silver  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Barrel Nickel/Silver   Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Material, Bias Ball Stainless Steel  Spring Test Probes Material, Bias Ball Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Bias Ball Stainless Steel   Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Material, Plating Gold Plated (Plunger)  Spring Test Probes Material, Plating Gold Plated (Plunger)  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plating Gold Plated (Plunger)   Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Material, Plunger Beryllium Copper  Spring Test Probes Material, Plunger Beryllium Copper  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Plunger Beryllium Copper   Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Material, Spring Stainless Steel  Spring Test Probes Material, Spring Stainless Steel  Smiths Interconnect Americas, Inc. Spring Test Probes Material, Spring Stainless Steel   Maximum Travel 0.090 In.  Smiths Interconnect Americas, Inc. Maximum Travel 0.090 In.  Spring Test Probes Maximum Travel 0.090 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Maximum Travel 0.090 In.   Minimum Centers 0.125 In.  Smiths Interconnect Americas, Inc. Minimum Centers 0.125 In.  Spring Test Probes Minimum Centers 0.125 In.  Smiths Interconnect Americas, Inc. Spring Test Probes Minimum Centers 0.125 In.   Primary Type Probe  Smiths Interconnect Americas, Inc. Primary Type Probe  Spring Test Probes Primary Type Probe  Smiths Interconnect Americas, Inc. Spring Test Probes Primary Type Probe   Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Tip Style Spherical Radius  Spring Test Probes Tip Style Spherical Radius  Smiths Interconnect Americas, Inc. Spring Test Probes Tip Style Spherical Radius   Type Battery Contact  Smiths Interconnect Americas, Inc. Type Battery Contact  Spring Test Probes Type Battery Contact  Smiths Interconnect Americas, Inc. Spring Test Probes Type Battery Contact   Working Travel 0.06  Smiths Interconnect Americas, Inc. Working Travel 0.06  Spring Test Probes Working Travel 0.06  Smiths Interconnect Americas, Inc. Spring Test Probes Working Travel 0.06  
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